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Logic testing and design for testability
Logic testing and design for testability
상세정보
- 자료유형
-
단행본
- ISBN
- 0262060965
- KDC
- 004.36-4
- 청구기호
- 004.36 F961ℓ
- 저자명
- Fujiwara, Hideo
- 서명/저자
- Logic testing and design for testability / by Hideo Fujiwara
- 발행사항
- London : MIT Press, 1985
- 형태사항
- x, 284 p : ill ; 23cm.
- 총서명
- Computer systems series
- 서지주기
- Includes index : p.279-284
- 서지주기
- Bibliography : p.272-279
- 가격
- \17,000
- Control Number
- hycl:17069
MARC
008980406s1985 uk a 001a eng■040 ▼a211063▼d211063
■020 ▼a0262060965
■056 ▼a004.36▼24
■090 ▼a004.36▼bF961ℓ
■1001 ▼aFujiwara, Hideo▼eby
■24510▼aLogic testing and design for testability▼dby Hideo Fujiwara
■260 ▼aLondon▼bMIT Press▼c1985
■300 ▼ax, 284 p▼bill▼c23cm.
■44000▼aComputer systems series
■504 ▼aIncludes index : p.279-284
■504 ▼aBibliography : p.272-279
■9500 ▼b\17,000
■990 ▼a남상순▼b이재우
